Giulio Di Giacomo was born in Cansano, Italy in 1933 and immigrated to America in 1954 when he married his wife Maria. They had 2 daughters while living in Brooklyn, New York.
Giulio is an expert in reliability of electronics and semiconductor devices, and electron microbeam spectrochemical analysis and electron diffraction. Giulio’s career began as a research physicist at the Naval Applied Science Laboratory (1963-1970) where he published papers in ultrasonics and electron microprobe analysis, and was issued two patents in those fields. In 1970 he joined IBM and retired in 2002 as a Senior Technical Staff Member and he contributed to major technologies such as Field Effect Transistors, Thermal Conduction Modules, and mathematical reliability models addressing failure mechanisms. Giulio also published 55 technical papers in science and technology journals, and was issued 24 patents in these development endeavors. He received Division and Outstanding awards during his career with IBM.
Giulio authored Reliability of Electronic Packages and Semiconductor Devices (Mcgraw- Hill) and Survival (Authorhouse). He co-authored Electrochemistry of Semiconductors and Electronics (Noyes Publications), Microelectronics Manufacturing Diagnostic Handbbook (Van Nostrand Reinhold), Area Array Interconnection Handbook (Kluwer Academic Publishers), Design for Microelectronics Reliability (Wiley Encyclopedia of Electrical and Electronics Engineering).
Giulio graduated from Brooklyn College with a BS degree in Physics and obtained an MS degree at the Polytechnic Institute of Brooklyn, where also enrolled in a PhD program in Metallurgical Engineering for three years (1963-2970), before joining IBM in 1970. He also completed courses at MIT, DuPont, and Philips Electronics. Giulio has taught technology courses in conferences across the US as well as in the IBM internal educational system. 
Giulio is currently enjoying his retirement in the Hudson Valley, New York.